Advanced Characterization - Transmission Electron Microscopy Intern

will use both focused ion beam (FIB) tools to prepare sample of thin films and TEM microscopes to determine microstructure of these thin.... Preferred Technical and Professional Expertise Experience with preparation of thin lamellas using focused ion beam tools...

Lugar: Albany, NY | 02/10/2024 22:10:28 PM | Salario: S/. No Especificado | Empresa: IBM